Title :
Speedier sequential tests via stochastic resonance
Author :
Guerriero, Marco ; Willett, Peter ; Marano, Stefano ; Matta, Vincenzo
Author_Institution :
ECE Dept., Connecticut Univ., Storrs, CT
fDate :
March 31 2008-April 4 2008
Abstract :
Stochastic resonance (SR) is a phenomenon long investigated by physicists that has recently attracted some interest in the signal processing literature. In this paper, we explore the potential benefits of the SR effect for shift-in-mean detection problems, specifically focusing on sequential decision rules. Amenable formulas for the optimal distribution of the SR noise, as well as an asymptotic comparison with the traditional Neyman-Pearson approach are obtained.
Keywords :
signal detection; signal processing; stochastic processes; Neyman-Pearson approach; sequential decision rules; shift-in-mean detection problems; signal processing; speedier sequential tests; stochastic resonance; Detectors; Physics; Sequential analysis; Signal analysis; Signal processing; Signal to noise ratio; Stochastic resonance; Strontium; Testing; Wireless sensor networks; Sequential Detection; Stochastic Resonance;
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2008.4518506
