DocumentCode :
3421760
Title :
Micro-alignment technique using 26-μm diameter microsolder bumps and its shear strength
Author :
Tsunetsugu, Hideki ; Hayashi, Tsuyoshi ; Katsura, Kohsuke
Author_Institution :
NTT Interdisciplinary Res. Labs., Tokyo, Japan
fYear :
1995
fDate :
4-6 Dec 1995
Firstpage :
52
Lastpage :
55
Abstract :
This paper reviews the bonding performance (alignment accuracy and shear strength) of the 26-μm-diameter microsolder bump connection. The feature of this technique is self-alignment of the optical chips due to the surface tension of the molten solder. The alignment accuracy increases as the number of bumps increases. An average misalignment of less than 0.2 μm was obtained for more than 20 bumps. The shear strength increases as the number of bumps and the percentage of Pb in the In-Pb solder increase, and the average shear strength for 50% In-Pb was about 1 gf/bump-about three times as large as the shear strength of 100% In. Furthermore, the decrease of shear strength for 50% In-Pb after 1000 heat cycles was very small-less than 10%. Therefore, this micro-alignment technique using 26-μm-diameter microsolder bumps will be very effective for future opto-electronic circuit boards and mounting photonic devices and optical waveguides/fibers
Keywords :
integrated optoelectronics; microassembling; optical interconnections; shear strength; soldering; 26 mum; In-Pb solder; InPb; alignment accuracy; bonding performance; heat cycles; high-speed photoreceiver; micro-alignment technique; microsolder bump connection; molten solder surface tension; optical chips; optical interconnections; opto-electronic circuit boards; photonic device mounting; shear strength; Bonding; High speed optical techniques; Integrated circuit interconnections; Optical devices; Optical fiber communication; Optical interconnections; Optical waveguides; Printed circuits; Semiconductor device measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
Conference_Location :
Omiya
Print_ISBN :
0-7803-3622-4
Type :
conf
DOI :
10.1109/IEMT.1995.540993
Filename :
540993
Link To Document :
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