Title :
Testing VLSI circuits from VHDL descriptions
Author :
Riesgo, T. ; Torroja, Y. ; de la Torre, E. ; Uceda, J.
Author_Institution :
Div. de Ingenieria Electron., Univ. Politecnica de Madrid, Spain
Abstract :
The authors describe a new testing strategy for VLSI digital circuits, based on the use of a hardware description language as an input file. The advantages of this method are pointed out. Circuits are described using the standard hardware description language VHDL. A behavioral fault model is proposed, defined as a perturbation of the VHDL code, and evaluated using a classical fault model as a reference. A description of all the tools required to achieve a complete testing system for high complexity circuits is provided. The approaches that have appeared in previous references are discussed
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; specification languages; VHDL; VLSI digital circuits; behavioral fault model; hardware description language; testing strategy; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Design automation; Digital circuits; Hardware design languages; Switches; System testing; Very large scale integration;
Conference_Titel :
Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0582-5
DOI :
10.1109/IECON.1992.254467