DocumentCode :
342371
Title :
Design of a transistor-mismatch-insensitive switched-current memory cell
Author :
Wang, Chunyan ; Ahmad, M. Omair ; Swamy, M.N.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
Volume :
2
fYear :
1999
fDate :
36342
Firstpage :
105
Abstract :
In this paper, we present a new and efficient switched-current memory cell consisting of six MOS transistors. A charge re-adjusting procedure is implemented in the memory cell to ensure an acceptable processing accuracy. Functionally, the current memory is insensitive to transistor parameter mismatch. The cell is currently under fabrication using 1.5-μm p-well single-poly technology with an area of about 50×25 μm2. Applications of the proposed memory cell for the design of a multi-purpose analog signal processing operator are also discussed
Keywords :
CMOS analogue integrated circuits; VLSI; analogue processing circuits; analogue storage; integrated circuit design; switched current circuits; 1.5 micron; SI memory cell; analog signal processing operator; charge re-adjusting procedure; p-well single-poly technology; six MOS transistor configuration; switched-current memory cell; transistor-mismatch-insensitive memory cell; Current mode circuits; Fabrication; MOS capacitors; MOSFETs; Signal design; Signal processing; Switches; Transistors; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
Type :
conf
DOI :
10.1109/ISCAS.1999.780630
Filename :
780630
Link To Document :
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