• DocumentCode
    3423922
  • Title

    Modeling and simulation of a nanowire-based cantilever structure

  • Author

    Bajpai, Ritu ; Tigli, Onur ; Zaghloul, Mona

  • Author_Institution
    Dept. of Electr. & Comput. Eng., George Washington Univ., Washington, DC
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Recently there has been a lot of research based on nanoscale structures and their applications but not a significant amount of modeling and simulation methods have been presented to expedite and simplify such work. In this paper we have shown that the commercially available MEMS enabled software tools can be used to model nanoscale structures of the order of hundreds of nanometers and that this kind of modeling can also be used to simulate the application of such structures into devices like sensors.. ZnO nanowires have been modeled as a cantilever structure and their frequency response has been studied. The calculated and the simulated resonance frequencies for the nanowires varying in length from 600 nm to 900 nm had an average difference of 0.5%. Change in frequency response of the cantilever with addition of external mass was also found to be in accordance with the theoretical formula.
  • Keywords
    II-VI semiconductors; electronic engineering computing; finite element analysis; frequency response; nanowires; wide band gap semiconductors; zinc compounds; MEMS enabled software tools; frequency response; nanoscale structures; nanowire-based cantilever structure; Application software; Frequency response; Micromechanical devices; Nanoscale devices; Nanostructures; Nanowires; Resonance; Resonant frequency; Software tools; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938458
  • Filename
    4938458