On ILP formulations for built-in self-testable data path synthesis

Author

Kim, Han Bin ; Ha, Dong Sam ; Takahashi, Takeshi

Author_Institution

Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

fYear

1999

fDate

1999

Firstpage

742

Lastpage

747

Abstract

In this paper, we present a new method for the built-in self-testable data path synthesis based on integer linear programming (ILP). Our method performs system register assignment, built-in self-test (BIST) register assignment, and interconnection assignment concurrently to yield optimal designs. Our experimental results show that our method successfully synthesizes BIST circuits for all six circuits experimented on. All the BIST circuits are better in area overhead than those generated by existing high-level BIST synthesis methods

Keywords

built-in self test; circuit optimisation; design for testability; high level synthesis; integer programming; integrated circuit interconnections; integrated circuit testing; linear programming; BIST register assignment; ILP formulations; area overhead; built-in self-testable data path synthesis; integer linear programming; interconnection assignment; optimal designs; system register assignment; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; High level synthesis; Integer linear programming; Integrated circuit interconnections; Permission; Registers; Scheduling;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1999. Proceedings. 36th

Conference_Location

New Orleans, LA

Print_ISBN

1-58113-092-9

Type

conf

DOI

10.1109/DAC.1999.782111

Filename

782111