DocumentCode :
3429335
Title :
High-aspect-ratio, ultrathick, negative-tone near-uv photoresist for MEMS applications
Author :
Despont, M. ; Lorenz, H. ; Fahrni, N. ; Brugger, J. ; Renaud, P. ; Vettiger, P.
Author_Institution :
Zurich Res. Lab., IBM Res. Div., Ruschlikon, Switzerland
fYear :
1997
fDate :
26-30 Jan 1997
Firstpage :
518
Lastpage :
522
Abstract :
Detailed investigations of the limits of a new negative-tone near-UV resist (IBM SU-8) have been performed. SU-8 is an epoxy-based resist designed specifically for ultrathick, high-aspect-ratio MEMS-type applications. We have demonstrated that with single-layer coatings, thicknesses of more than 500 μm can be achieved reproducibly. Thicker resist layers can be made by multiple coatings, and we have achieved exposures in 1200-μm-thick, double coated SU-8 resist layers. We have found that the aspect ratio for near-UV (400 nm) exposed and developed structures can be greater than 18 and remains constant in the thickness range between 80 and 1200 μm. Vertical sidewall profiles result in good dimensional control over the entire resist thickness. To our knowledge, this is the highest aspect ratio reported for near-UV exposures and resist thicknesses. These results will open up new possibilities for low-cost LIGA-type processes for MEMS applications. In addition, the SU-8 material has interesting mechanical properties which also makes it attractive for photoplastic device fabrication
Keywords :
micromechanical devices; photoresists; 400 nm; 80 to 1200 mum; LIGA; MEMS; SU-8; Si; dimensional control; epoxy-based resist; multiple coatings; near-UV exposures; negative-tone near-UV resist; photoplastic device fabrication; resist thicknesses; single-layer coatings; vertical sidewall profiles; Coatings; Costs; EPON; Fabrication; Micromechanical devices; Optical scattering; Resins; Resists; Thickness control; X-ray lithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
Conference_Location :
Nagoya
ISSN :
1084-6999
Print_ISBN :
0-7803-3744-1
Type :
conf
DOI :
10.1109/MEMSYS.1997.581916
Filename :
581916
Link To Document :
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