• DocumentCode
    3429441
  • Title

    Development of LCR laser function trimming unit

  • Author

    Yamaguchi, Kazuyoshi

  • Author_Institution
    Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • fYear
    1995
  • fDate
    4-6 Dec 1995
  • Firstpage
    283
  • Lastpage
    286
  • Abstract
    Electronic circuits are now adjusted with variable inductors, trimmer capacitors, and pre-set resistors. The use of these components, however, has caused critical problems for circuit reliability because they have turning parts that generate displacement due to variation with time. We have developed a new function trimming unit that uses green laser light and enables automatic adjustment of L, C, and R with a single unit. Conventional laser trimming is performed by using the fundamental wave (1064 nm) of a YAG laser. Since the reflection factor of the YAG laser against copper is approximately 90%, it is difficult to achieve high quality trimming. We use the single trimming unit and the second harmonic generation (SHG) of the YAG laser with a lower metal reflection factor for trimming all LCR components, particularly copper foil pattern coils for high-frequency circuits
  • Keywords
    capacitors; circuit reliability; electron device manufacture; inductors; laser beam machining; laser materials processing; microstrip circuits; optical harmonic generation; thin film resistors; 532 nm; Cu; Cu foil pattern coils; LCR component trimming; LCR laser function trimming unit; YAG; YAG laser; YAl5O12; circuit reliability; electronic circuit adjustment; green laser light; high-frequency circuits; metal reflection factor; microstrip circuit; pre-set resistors; second harmonic generation; single trimming unit; trimmer capacitors; variable inductors; Capacitors; Circuits; Coils; Copper; Electrodes; Fiber lasers; Inductors; Optical reflection; Resistors; Turning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
  • Conference_Location
    Omiya
  • Print_ISBN
    0-7803-3622-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.541045
  • Filename
    541045