Title :
Using at-speed BIST to test LVDS serializer/deserializer function
Author :
Eckersand, Magnus ; Franzon, Fredrik ; Filliter, Ken
Author_Institution :
National Semiconductor/Sweden
Keywords :
Built-in self-test; Clocks; Fault detection; Logic devices; Logic testing; Power cables; Proposals; Standards development; System testing; Transmission lines;
Conference_Titel :
Test Workshop, 2001. IEEE European
Print_ISBN :
0-7695-1017-5
DOI :
10.1109/ETW.2001.946680
