DocumentCode :
3431407
Title :
Tutorial T7A: Advanced IC Packaging
Author :
Beyne, Eric
Author_Institution :
IMEC, Leuven
fYear :
2007
fDate :
6-10 Jan. 2007
Firstpage :
10
Lastpage :
10
Abstract :
This course will address advanced packaging and assembly technologies. Demands for increased miniaturization and performance of electronic systems have driven traditional IC packaging technologies to higher levels of sophistication and miniaturization. The different styles of IC packages and their evolution will be discussed, from through-hole to surface mount, from leaded to leadless packages and from 2D to 3D packaging. Novel technology trends will be discussed, in particular wafer level packaging and 3D packaging technologies. The ultimate miniaturised package has a size equal to the die size. Such packages may be fabricated at the wafer level, before die singulation. This not only results in the smallest possible packages, but also enables cost reduction. All die on a wafer are simultaneously packaged, in contrast to the sequential traditional package flows. Further miniaturization and performance enhancement of electronic systems will more and more require the use of 3D interconnection schemes. Key technologies for realizing true 3D interconnect schemes are the realization of vertical connections, either through the Si-die or through the multilayer interconnect with embedded die. Different applications require different complexities of 3D-interconnectivity. Therefore, different technologies may be used. These can be categorized as a more traditional packaging approach, a wafer- level-packaging, WLP (´above´ passivation), approach and a foundry level (´below´ passivation) approach. The trends for these different 3D-flavours will be discussed in more detail.
Keywords :
integrated circuit interconnections; surface mount technology; wafer level packaging; 2D packaging technologies; 3D interconnection schemes; 3D packaging technologies; WLP; advanced IC packaging; advanced assembly technologies; electronic systems; embedded die; surface mount technologies; wafer level packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-2762-0
Type :
conf
DOI :
10.1109/VLSID.2007.171
Filename :
4092003
Link To Document :
بازگشت