DocumentCode :
3431536
Title :
Tutorial IND2B: Structured Embedded Configuration and Test
Author :
Clark, C.J.
Author_Institution :
Intellitech Corp.
fYear :
2007
fDate :
6-10 Jan. 2007
Firstpage :
17
Lastpage :
17
Abstract :
Embedded infrastructure IP to optimize chip-level manufacturing test and debugging has become common practice. However, adopting the same approach for boards and systems requires a different family of infrastructure IP. This tutorial introduces a structured, standards-based approach to PCB self-test and FPGA configuration and presents how it can optimize manufacturing test and debugging, leverage ASIC level DFT, and support configurability, especially in today´s re configurable products. Today´s complex IC relies on scan and BIST for the majority of the test coverage achieved. Software driven functional self-test for PCBs and Systems now requires a solid foundation of scan-based self-test due to the complexity and skill required to achieve high fault coverage and useful diagnostics. Off-the-shelf infrastructure IP based on IEEE standards will enable system designers to build in the field re-configurable and high quality self-testable products with a minimum of engineering time and effort. Furthermore, the convergence of the FPGA configuration standard and scan-based test presents the designers new opportunities to increase fault coverage, lower their manufacturing test costs, field support costs, and extend their products´ useful life with in-the-field updates. Infrastructure IP for the board and system level will save engineering time and will reduce design risk since they are pre-engineered and leverage IEEE standards. The standards-based solutions are re-usable, from one phase of a single product life cycle to the next, and from one product design to the next
Keywords :
IEEE standards; boundary scan testing; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; printed circuit manufacture; printed circuit testing; program debugging; ASIC; DFT; FPGA configuration; IEEE standards; chip-level manufacturing test; debugging; fault coverage; fault diagnostics; functional self-test; off-the-shelf infrastructure IP; product life cycle; scan-based self-test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-2762-0
Type :
conf
DOI :
10.1109/VLSID.2007.164
Filename :
4092010
Link To Document :
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