DocumentCode
343161
Title
Analog VLSI parameter fault diagnosis via neural network
Author
Junren, Gan ; Bijuan, Wang ; Linshen, Yao
Author_Institution
Inst. of Metall., Acad. Sinica, Beijing, China
fYear
1998
fDate
1998
Firstpage
381
Lastpage
384
Abstract
A new method for analog integrated circuit fault parameter diagnosis is presented in this paper. It is based on neural network theory and has several advantages over normal methods. The method is applied to several examples and it works very well
Keywords
analogue integrated circuits; backpropagation; circuit simulation; fault simulation; integrated circuit modelling; neural nets; ANN model; analog VLSI; backpropagation; fault parameter diagnosis; hidden layer nodes; neural network theory; simulation-before testing model; Analog circuits; Analog integrated circuits; Artificial neural networks; Circuit faults; Circuit simulation; Circuit testing; Differential equations; Fault diagnosis; Neural networks; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4306-9
Type
conf
DOI
10.1109/ICSICT.1998.785901
Filename
785901
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