Title :
Recursive block structured data compression
Author :
Tilgner, Marco ; Ishida, Masahiro ; Yamaguchi, Takahiro
Author_Institution :
Dept. of Math. & Comput. Sci., Tokyo Inst. of Technol., Japan
Abstract :
Summary form only given. A simple algorithm for efficient lossless compression of circuit test data with fast decompression speed is presented. It can easily be converted into a VLSI implementation. The algorithm is based on recursive block structured run-length coding and compresses at ratios of about 6:1 to 1000:1, higher than most of the widely known compression techniques
Keywords :
block codes; circuit testing; data compression; data structures; electrical engineering computing; runlength codes; VLSI implementation; circuit test data; fast decompression speed; recursive block structured data compression; Circuit testing; Data compression; Laboratories; Very large scale integration;
Conference_Titel :
Data Compression Conference, 1997. DCC '97. Proceedings
Conference_Location :
Snowbird, UT
Print_ISBN :
0-8186-7761-9
DOI :
10.1109/DCC.1997.582139
