Title :
Spatial sampling criteria for recognition of structures
Author :
Han Yueping ; Li Ruihong ; Han Yan
Author_Institution :
Electron. Test & Meas. Lab., North Univ. of China, Taiyuan, China
Abstract :
Spatial sampling criteria based on a single view X-ray imaging system are proposed for recognition of the interior assembly structures of complex products. There must be a maximal rotary step for an object within which the least structural size to be tested is ascertained in advance. Rotating the object by the step and imaging it and so on until a 360° turn is completed, an image sequence is obtained that includes the full structural information for recognition. The maximal rotary step is restricted by the least structural size and the resolution of the imaging system. Based on the criteria, the first domestic X-ray digital test system has been developed and applied to the online inspection of objects containing complicated assembly structures.
Keywords :
X-ray imaging; assembling; image recognition; image resolution; image sequences; inspection; production engineering computing; complex products; domestic X-ray digital test system; image sequence; imaging system resolution; interior assembly structure recognition; maximal rotary step; online inspection; single view X-ray imaging system; spatial sampling criteria; Computed tomography; Image recognition; Inspection; Radiography; Steel; X-ray imaging; X-ray; maximal rotary step; spatial sampling criteria; the least structural size;
Conference_Titel :
Computer Science & Education (ICCSE), 2011 6th International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9717-1
DOI :
10.1109/ICCSE.2011.6028649
