Title :
Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy
Author :
Sidiroglou, Fotios ; Stern, Richard ; Fletcher, Ian R. ; Huntington, Shane T. ; Baxter, Gregory W. ; Roberts, Ann
Author_Institution :
Sch. of Phys., Univ. of Melbourne, Melbourne, VIC
Abstract :
Dopant profiles in erbium doped optical fibres acquired by the application of fluorescence intensity based confocal microscopy technique and the employment of a nanoscale-secondary ion mass spectrometry (NanoSIMS) system are presented and compared.
Keywords :
doping profiles; erbium; fluorescence spectroscopy; ion microprobe analysis; optical fibres; secondary ion mass spectroscopy; Er; NanoSIMS system; dopant profiles; erbium doped optical fibres; fluorescence confocal microscopy; fluorescence intensity; ion microprobe; nanoscale-secondary ion mass spectrometry system; Australia; Doped fiber amplifiers; Erbium; Erbium-doped fiber lasers; Fluorescence; Optical fiber communication; Optical fibers; Optical microscopy; Preforms; Transmission electron microscopy;
Conference_Titel :
Optical Fibre Technology/Australian Optical Society, 2006. ACOFT/AOS 2006. Australian Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-0-9775657-1-9
Electronic_ISBN :
978-0-9775657-1-9
DOI :
10.1109/ACOFT.2006.4519301
