PM noise generated by noisy components

Author

Ascarrunz, H.D. ; Zhang, Aimin ; Ferre-Pikal, E.S. ; Walls, F.L.

Author_Institution

SpectraDynamics, Lafayette, CO, USA

fYear

1998

fDate

27-29 May 1998

Firstpage

210

Lastpage

217

Abstract

This paper investigates the phase modulation (PM) noise generated by intrinsic reactance fluctuations in signal carrying components. We report the fractional fluctuation in the reactance of commonly available capacitors, inductors and varactors. Fractional fluctuations were inferred by measuring the phase shift of the carrier signal across the components and the resulting PM noise due to intrinsic fluctuations. In addition, various methods to reduce the effect of intrinsic noise in low noise circuit applications are discussed

Keywords

capacitors; circuit noise; electric noise measurement; electron device noise; fluctuations; inductors; leakage currents; phase modulation; varactors; PM noise; carrier signal; fractional fluctuation; fractional fluctuations; intrinsic fluctuations; intrinsic reactance fluctuations; low noise circuit applications; phase modulation noise; phase shift; reactance; signal carrying components; 1f noise; Capacitors; Circuit noise; Fluctuations; Inductors; Noise generators; Noise reduction; Phase modulation; Phase noise; Signal generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International

Conference_Location

Pasadena, CA

ISSN

1075-6787

Print_ISBN

0-7803-4373-5

Type

conf

DOI

10.1109/FREQ.1998.717907

Filename

717907