• DocumentCode
    34355
  • Title

    Optical Bistability Investigation in a Nonlinear Silicon Microring Circuit

  • Author

    Chiangga, S. ; Pitakwongsaporn, S. ; Frank, T.D. ; Yupapin, Preecha P.

  • Author_Institution
    Dept. of Phys., Kasetsart Univ., Bangkok, Thailand
  • Volume
    31
  • Issue
    7
  • fYear
    2013
  • fDate
    1-Apr-13
  • Firstpage
    1101
  • Lastpage
    1105
  • Abstract
    We describe the optical bistability phenomenon in a silicon-on-insulator microring resonators device by using an analytical theory, which includes both linear and nonlinear effects such as two-photon absorption, Kerr effect, free carrier and thermo-optic effect (TOE). We show that the bistable switching threshold and the hysteresis loop width can be tuned by geometrical parameters of the device and by the nonlinear parameters. The accuracy of the analytical approach is verified by comparing the spectrum responds with the predicting data from a commercial finite-difference time-domain software tool, and a very close agreement is found between the two when TOE is incorporated in analytical theory. In addition, our analysis reveals that a new type of hysteresis loop occurs at low input intensity. The mode suppression of the designed device by Vernier effect for tunable filter applications is also briefly discussed.
  • Keywords
    elemental semiconductors; integrated optics; micromechanical resonators; optical bistability; silicon; silicon-on-insulator; Kerr effect; analytical theory; free carrier; nonlinear effects; nonlinear silicon microring circuit; optical bistability phenomenon; silicon-on-insulator microring resonators device; thermo-optic effect; tunable filter applications; two-photon absorption; Educational institutions; Optical bistability; Optical filters; Optical resonators; Optical waveguides; Silicon; Bistability; integrated optics; nonlinear effects; ring resonator; silicon-on-insulator;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2013.2243819
  • Filename
    6423770