DocumentCode :
3435589
Title :
Connection error location and correction in combinational circuits
Author :
Wahba, Ayman M. ; Borrione, Dominique
Author_Institution :
TIMA Lab., Modelisation et Verification des Syst. Digitaux, Grenoble, France
fYear :
1997
fDate :
17-20 Mar 1997
Firstpage :
235
Lastpage :
241
Abstract :
We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the PrevailTM system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns
Keywords :
combinational circuits; errors; fault diagnosis; fault location; logic testing; Prevail system; combinational circuit; connection error correction; connection error location; diagnostic algorithm; test pattern generation; Circuit simulation; Circuit testing; Combinational circuits; Counting circuits; Error correction; Fault diagnosis; Inverters; Laboratories; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
ISSN :
1066-1409
Print_ISBN :
0-8186-7786-4
Type :
conf
DOI :
10.1109/EDTC.1997.582365
Filename :
582365
Link To Document :
بازگشت