Title :
Bistatic scattering characterization of a complex object
Author :
Eigel, R.L., Jr. ; Terzuoli, A.J.
Author_Institution :
Air Force Inst. of Technol., Dayton, OH, USA
Abstract :
Although much of the radar development over the past fifty years has been focused in the monostatic domain, a bistatic detection approach offers several key benefits. Without proper understanding of the bistatic scattering mechanisms, utilization of these benefits may not be fully realized This paper addresses some phenomenological aspects of bistatic scattering from a complex object with an emphasis on specular, shadowing, dihedral and cavity effects. Both ray tracing and scattering center approaches are used to describe the bistatic mechanisms. An appraisal of the effectiveness and utility of the bistatic equivalence theorems and several commercial scattering prediction codes are also accomplished. Finally some rules of thumb are proposed to help guide the reader in evaluating the bistatic scattering of complex shapes in general.
Keywords :
electromagnetic wave scattering; radar detection; ray tracing; bistatic detection; bistatic equivalence theorem; bistatic mechanisms; bistatic scattering characterization; cavity effects; complex object; dihedral effects; radar; ray tracing; scattering prediction code; shadowing; specular effects; Electromagnetic measurements; Electromagnetic scattering; Equations; Frequency; Optical scattering; Radar detection; Radar scattering; Ray tracing; Shadow mapping; Shape;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.788301