• DocumentCode
    3435876
  • Title

    Ultra low cost analog BIST using spectral analysis

  • Author

    Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro Amadeu

  • Author_Institution
    Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2003
  • fDate
    27 April-1 May 2003
  • Firstpage
    77
  • Lastpage
    82
  • Abstract
    In this work, a low cost method to implement an analog BIST scheme for the system on chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practical results illustrating limitations and advantages of the proposed technique.
  • Keywords
    analogue-digital conversion; built-in self test; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; spectral analysis; system-on-chip; 1 bit; SOC; analog circuit partitioning; analog information capture; analog test; digital-based spectral analysis; single bit digitizer; system on chip; ultra low cost analog BIST; Analog circuits; Autocorrelation; Built-in self-test; Circuit noise; Circuit testing; Costs; Digital signal processing; Frequency; Spectral analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2003. Proceedings. 21st
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-1924-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2003.1197636
  • Filename
    1197636