DocumentCode
3435876
Title
Ultra low cost analog BIST using spectral analysis
Author
Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro Amadeu
Author_Institution
Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear
2003
fDate
27 April-1 May 2003
Firstpage
77
Lastpage
82
Abstract
In this work, a low cost method to implement an analog BIST scheme for the system on chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practical results illustrating limitations and advantages of the proposed technique.
Keywords
analogue-digital conversion; built-in self test; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; spectral analysis; system-on-chip; 1 bit; SOC; analog circuit partitioning; analog information capture; analog test; digital-based spectral analysis; single bit digitizer; system on chip; ultra low cost analog BIST; Analog circuits; Autocorrelation; Built-in self-test; Circuit noise; Circuit testing; Costs; Digital signal processing; Frequency; Spectral analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2003. Proceedings. 21st
ISSN
1093-0167
Print_ISBN
0-7695-1924-5
Type
conf
DOI
10.1109/VTEST.2003.1197636
Filename
1197636
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