Title :
Decision diagrams method for k-out-of-n: G systems
Author :
Shu-Min Li ; Shu-Bin Si ; Shuai Zhang ; Hong-Yan Dui
Author_Institution :
Sch. of Mechantronics, Northwestern Polytech. Univ., Xi´an, China
Abstract :
Binary k-out-of-n system is a commonly used reliability model in engineering practice. Many researches have extended the concept of k-out-of-n system to multi-state k-out-of-n systems. This paper proposes a binary decision diagram (BDD) based approach for binary k-out-of-n system: G system and a multi-state multi-valued decision diagram (MMDD) based approach for multi-state k-out-of-n: G system. BDD and MMDD have been extensively used for representing and manipulating logic functions in many areas, including reliability modeling and analysis. In this paper, patterns of BDD/MMDD for binary/multi-state k-out-of-n: G system are summarized and proved, and a two-step algorithmic process is proposed for modeling BDD/MMDD, a case is implemented to demonstrate the performance of the presented method.
Keywords :
binary decision diagrams; reliability theory; G system; MMDD based approach; binary decision diagram; binary k-out-of-n system; logic function manipulation; logic function representation; multistate k-out-of-n system; multistate multivalued decision diagram; reliability model; two-step algorithmic process; Algorithm design and analysis; Boolean functions; Data structures; Indexes; Reliability engineering; Safety; G systems; binary decision diagrams; k-out-of-n; multi-state multi-valued decision diagram;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
DOI :
10.1109/QR2MSE.2013.6625580