Title :
Deconvolution of the intrinsic spectrum of AlGaInP microcavity light-emitting diodes
Author :
Royo, P. ; Stanley, R.P. ; Ilegems, M. ; Streubel, K. ; Gulden, K.H.
Author_Institution :
Inst. de Micro- et Optoelectron., Ecole Polytech. Federale de Lausanne, Switzerland
Abstract :
Knowledge of the intrinsic emission spectrum is critical in assessing the performances of microcavity light-emitting diodes. We present a non-destructive method of determining the intrinsic spectra by deconvoluting angle-resolved spectral measurements. Similar measurements on conventional light-emitting diodes confirmed the accuracy of the method
Keywords :
III-V semiconductors; aluminium compounds; deconvolution; gallium compounds; indium compounds; light emitting diodes; AlGaInP; angle-resolved spectral measurements; intrinsic emission spectrum; microcavity light-emitting diodes; spectrum deconvolution; Deconvolution; Goniometers; Integral equations; Light emitting diodes; Microcavities; Mirrors; Photonics; Resonance; Vertical cavity surface emitting lasers; Wavelength measurement;
Conference_Titel :
Compound Semiconductors, 2000 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-6258-6
DOI :
10.1109/ISCS.2000.947194
