DocumentCode
3437597
Title
Deconvolution of the intrinsic spectrum of AlGaInP microcavity light-emitting diodes
Author
Royo, P. ; Stanley, R.P. ; Ilegems, M. ; Streubel, K. ; Gulden, K.H.
Author_Institution
Inst. de Micro- et Optoelectron., Ecole Polytech. Federale de Lausanne, Switzerland
fYear
2000
fDate
2000
Firstpage
431
Lastpage
435
Abstract
Knowledge of the intrinsic emission spectrum is critical in assessing the performances of microcavity light-emitting diodes. We present a non-destructive method of determining the intrinsic spectra by deconvoluting angle-resolved spectral measurements. Similar measurements on conventional light-emitting diodes confirmed the accuracy of the method
Keywords
III-V semiconductors; aluminium compounds; deconvolution; gallium compounds; indium compounds; light emitting diodes; AlGaInP; angle-resolved spectral measurements; intrinsic emission spectrum; microcavity light-emitting diodes; spectrum deconvolution; Deconvolution; Goniometers; Integral equations; Light emitting diodes; Microcavities; Mirrors; Photonics; Resonance; Vertical cavity surface emitting lasers; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 2000 IEEE International Symposium on
Conference_Location
Monterey, CA
Print_ISBN
0-7803-6258-6
Type
conf
DOI
10.1109/ISCS.2000.947194
Filename
947194
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