Title :
Test generation of C-testable array dividers
Author :
Wey, Chin-Long ; Chang, Sin-Min
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
The design of C-testable array dividers that are tested with a test set of constant length irrespective of the circuit size is presented. The results show that the proposed designs of n-by- n nonrestoring and restoring array dividers are C-testable and can be fully tested using only 20 and 40 test patterns, respectively. Algorithms that generate the test patterns and expected outputs are also provided
Keywords :
cellular arrays; logic testing; C-testable array dividers; test generation; test patterns; Arithmetic; Circuit faults; Circuit testing; Iterative methods; Labeling; Logic arrays; Logic devices; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Rye Brook, NY
Print_ISBN :
0-8186-0872-2
DOI :
10.1109/ICCD.1988.25678
