DocumentCode
3437809
Title
Robust estimation of LP parameters in white noise with unknown variance
Author
Trabelsi, A. ; Boukadoum, M. ; Boyer, F.R.
Author_Institution
Dept. of Comput. Sci., Univ. du Quebec a Montreal, Montreal, QC, Canada
fYear
2009
fDate
13-16 Dec. 2009
Firstpage
335
Lastpage
338
Abstract
The problem of robust estimation of the linear prediction (LP) parameters for an autoregressive process (AR) in white noise is addressed in this paper. The classical solution to this problem involves using the p low-order Yule-Walker equations and subtracting an estimate of the noise variance from the main diagonal of the correlation matrix. However, this approach lacks robustness against possible oversubtraction of the noise variance. In such a case, the resulting estimate of the correlation matrix won´t constrain to be positive-definite. The main contribution of this paper is the combination of an appropriate noise variance estimator with an effective processing scheme to circumvent the problem mentioned above. The noise variance, which determines the bias in the standard least-squares criterion, is estimated using the overdetermined normal equations, the truncated singular value decomposition and the correlation matching property. It is shown that for an AR process in additive white noise, the present method performs better than that proposed by the authors in previous related work.
Keywords
autoregressive processes; correlation theory; matrix algebra; correlation matching property; correlation matrix; linear prediction parameters robust estimation; overdetermined normal equations; p low-order Yule-Walker equations; speech signal; standard least squares criterion; truncated singular value decomposition; unknown variance; white noise; Additive white noise; Autocorrelation; Computer science; Equations; Noise reduction; Noise robustness; Parameter estimation; Speech analysis; White noise; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits, and Systems, 2009. ICECS 2009. 16th IEEE International Conference on
Conference_Location
Yasmine Hammamet
Print_ISBN
978-1-4244-5090-9
Electronic_ISBN
978-1-4244-5091-6
Type
conf
DOI
10.1109/ICECS.2009.5411004
Filename
5411004
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