DocumentCode :
3437836
Title :
Can you make one size fit all? [synthetic instrument]
Author :
Stratton, John
Author_Institution :
Agilent Technol., Inc., Santa Rosa, CA, USA
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
162
Lastpage :
165
Abstract :
With the contract award of the ARGCS (agile rapid global combat support) ACTD (advanced concept technology demonstration) last September, the DoD is making great advances toward a more cost efficient and coordinated military support organization. One attribute of ARGCS is to develop and demonstrate a synthetic instrument as a possible replacement of the growing plethora of general-purpose and customized test equipment currently deployed in the military´s most widely used automatic test systems (ATS). This paper describes an ideal synthetic instrument (SI), technology trends that make the ideal SI possible, trade-offs instrument manufacturers are making based on available technology, ramifications to test systems integrators and users based on these trade-offs.
Keywords :
automatic test equipment; automatic testing; ATS; automatic test equipment; automatic test systems; synthetic instrument; Automatic testing; Computer architecture; Costs; Frequency conversion; Image converters; Instruments; Performance analysis; Signal analysis; Signal generators; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609120
Filename :
1609120
Link To Document :
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