DocumentCode :
3438503
Title :
Advanced virtual instrument test system (AVITS)
Author :
McHugh, Mark ; Cluer, Steve ; Deffler, James
Author_Institution :
Naval Surface Warfare Center, Seal Beach, CA
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
348
Lastpage :
353
Abstract :
The Advanced Virtual Instrument Test System (AVITS) is a joint service demonstration project intended to facilitate the exploitation of virtual electronic test equipment technologies available commercially. The urgent need for a technology such as this is currently most apparent in the Navy because of both the pending reductions in available manpower/expertise on board ships, and the realization that a shift of workload to the shore infrastructure will not fully facilitate Crew Optimization goals; maintenance will still have to be done on board, especially underway. Technology must be put in place which will bridge the gap between the expertise available on board and the expertise required by placing the needed technical resources actually in the space where it is needed. AVITS proposes to marry the technical resource conduit such as Joint Distance Support and Response (JDSR) to the electronic test equipment being used by the maintainer. Once realized, the AVITS concept can facilitate the same Sailor-Technician repairing and maintaining a wide variety of systems without the benefit of formal schooling. While the need for technology such as this is most apparent in the Navy, a capability of this type stands to provide similar maintenance, training, and data collection benefits throughout DoD
Keywords :
test equipment; virtual instrumentation; AVITS; advanced virtual instrument test system; crew optimization; electronic test equipment; joint distance support and response; joint service demonstration project; Electronic equipment testing; Electronic warfare; Force measurement; Instruments; Marine vehicles; Sea measurements; Seals; Space technology; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609156
Filename :
1609156
Link To Document :
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