DocumentCode :
3438934
Title :
Knowledge base to manage the grading and selection of testability guidelines
Author :
Ungar, Louis Y. ; Parameswaran, Rajini
Author_Institution :
A.T.E. Solutions, Inc., Los Angeles, CA
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
444
Lastpage :
450
Abstract :
A management system, called The TestEnablisttrade is introduced which can deal with the large variety of design for testability (DFT) guidelines available in industry. It is a commonly accepted notion that the most effective DFT technique is one that is incorporated during the normal design activity. Designers, however, may have difficulty recognizing where DFT is needed and which of the myriad of guidelines is applicable to a particular circuit or signal. The selected test strategy and mix of inspection, automatic test equipment (ATE) and built-in self test (BIST) utilized also impacts the selection of guidelines. The TestEnablist is tasked with monitoring the design´s testability and to recommend only those guidelines, which are applicable to the circuit and are appropriate for the selected test strategy. Designers are then able to choose among applicable DFT guidelines while they are designing. The TestEnablist accomplishes these tasks by utilizing a knowledge base of industry-generated testability guidelines that are indexed to the selected test strategy as well as to specific design criteria and testability attributes. This paper describes the requirements, use and implementation of The TestEnablist
Keywords :
automatic test equipment; built-in self test; circuit testing; design for testability; inspection; ATE; BIST; DFT guidelines; DFT technique; The TestEnablist; automatic test equipment; built-in self test; design for testability guidelines; industry-generated testability guidelines; Automatic test equipment; Automatic testing; Built-in self-test; Circuit testing; Design for testability; Guidelines; Inspection; Knowledge management; Signal design; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609177
Filename :
1609177
Link To Document :
بازگشت