• DocumentCode
    3439271
  • Title

    Catching up with the real world: requirements for next-generation test instruments

  • Author

    Truebenbach, Eric

  • Author_Institution
    Teradyne, Inc., North Reading, MA
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    547
  • Lastpage
    553
  • Abstract
    This paper provides an overview of the key problems of open-architecture test in general, and digital test in particular. It then proposes some instrument features that would allow the test engineer to specify operation in terms more closely aligned with the test specification (UUT-centric test) rather than in terms more closely aligned with the instrument capabilities (instrument-centric test). These instrument features include: 1) Including pre-programmed functions based on common use, 2) Acknowledgement of the bus-structured trend in interfaces, 3) Close association of the protocol and functions with the instrument, 4) "Set and forget" protocol definition
  • Keywords
    protocols; test equipment; UUT-centric test; bus-structured trend; digital test; next generation test instrument; open architecture test; set and forget protocol; test specification; Base stations; Instruments; Mobile handsets; Modems; Power supplies; Protocols; Radio frequency; Software testing; Software tools; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609195
  • Filename
    1609195