DocumentCode
3439271
Title
Catching up with the real world: requirements for next-generation test instruments
Author
Truebenbach, Eric
Author_Institution
Teradyne, Inc., North Reading, MA
fYear
2005
fDate
26-29 Sept. 2005
Firstpage
547
Lastpage
553
Abstract
This paper provides an overview of the key problems of open-architecture test in general, and digital test in particular. It then proposes some instrument features that would allow the test engineer to specify operation in terms more closely aligned with the test specification (UUT-centric test) rather than in terms more closely aligned with the instrument capabilities (instrument-centric test). These instrument features include: 1) Including pre-programmed functions based on common use, 2) Acknowledgement of the bus-structured trend in interfaces, 3) Close association of the protocol and functions with the instrument, 4) "Set and forget" protocol definition
Keywords
protocols; test equipment; UUT-centric test; bus-structured trend; digital test; next generation test instrument; open architecture test; set and forget protocol; test specification; Base stations; Instruments; Mobile handsets; Modems; Power supplies; Protocols; Radio frequency; Software testing; Software tools; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2005. IEEE
Conference_Location
Orlando, FL
Print_ISBN
0-7803-9101-2
Type
conf
DOI
10.1109/AUTEST.2005.1609195
Filename
1609195
Link To Document