DocumentCode :
343946
Title :
Fault diagnosis for mixed-signal electronic systems
Author :
Chakrabarti, Sudip ; Cherubal, Sasikumar ; Chatterjee, Avhishek
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
169
Abstract :
In this paper, we propose an efficient methodology to diagnose faults in complex mixed-signal systems. The proposed technique combines the advantages of simulation-before-test and simulation-after-test approaches. Given a faulty circuit, a hierarchical fault dictionary (a list of all faulty behaviors of the circuit, used for fault location) is used to locate the faulty component. The computational requirements during fault dictionary construction are minimized by hierarchical fault clustering and behavioral fault modeling. The resulting fault dictionary is most compact in size and contains complete diagnostic accuracy. Once the faulty component is identified, a novel parameter identification algorithm determines the values of the parameters corresponding to the faulty component. The proposed approach minimizes the off-line computation required by a fault dictionary technique as well as the online computation that is typical of a simulation-after-test technique. It is also robust to component tolerances and measurement inaccuracies, as the precise values of the parameters are determined. Finally, the proposed fault diagnosis technique can diagnose a faulty component at any level of design hierarchy, or identify the exact value of the faulty parameters, according to the intended resolution of diagnosis
Keywords :
automatic testing; circuit simulation; fault diagnosis; hierarchical systems; integrated circuit testing; mixed analogue-digital integrated circuits; parameter estimation; behavioral fault modeling; computational requirements; fault diagnosis; fault location; hierarchical fault clustering; hierarchical fault dictionary; mixed-signal electronic systems; off-line computation; online computation; parameter identification algorithm; simulation-after-test; simulation-after-test technique; simulation-before-tes; Aerospace testing; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Dictionaries; Electrical fault detection; Fault diagnosis; Fault location;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 1999. Proceedings. 1999 IEEE
Conference_Location :
Snowmass at Aspen, CO
Print_ISBN :
0-7803-5425-7
Type :
conf
DOI :
10.1109/AERO.1999.789776
Filename :
789776
Link To Document :
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