Title :
Enhancement-mode GaN MIS-HEMTs for power supplies
Author :
Imada, T. ; Kanamura, M. ; Kikkawa, T.
Author_Institution :
FUJITSU Labs. Ltd., Atsugi, Japan
Abstract :
In this paper, we present the current status of GaN-high electron mobility transistor (HEMT) for power-supply-applications. Advantages of GaN HEMT are summarized with discussing required characteristics applying for power supplies. Then, we introduce our Enhancement-mode (E-mode) GaN MIS-HEMT technology. We focused on realizing both normally-off operation and high current density with high breakdown voltage. Detailed results are discussed in this paper. In particular, we developed a unique device structure called triple layer cap structure. High current density with normally-off mode was successfully achieved, which is preferable for power-supply application. We also demonstrated high speed performance with low on-resistance.
Keywords :
MIS devices; gallium compounds; high electron mobility transistors; power supply circuits; GaN; breakdown voltage; current density; enhancement-mode MIS-HEMT; high electron mobility transistor; normally-off operation; power supply applications; triple layer cap structure; Aluminum gallium nitride; Controllability; Current density; Electrons; Epitaxial growth; Gallium nitride; HEMTs; Power supplies; Silicon carbide; Surface resistance; ALD; Enhancement-mode; GaN; MIS-HEMT;
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
DOI :
10.1109/IPEC.2010.5542039