DocumentCode :
3441835
Title :
Notice of Retraction
Assessment model for battle damage location process based on diagram entropy method
Author :
Quan Shi ; Zhifeng You ; Qiwei Hu ; Yuansheng Dong
Author_Institution :
Manage. Eng. Dept., Mech. Eng. Coll., Shijiazhuang, China
fYear :
2013
fDate :
15-18 July 2013
Firstpage :
1637
Lastpage :
1640
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

The quality of battle damage location process (BDLP) is very important for the efficiency of damage location. The person´s location ability can also be reacted by it. However, measuring complexity of BDLP is a rather new area of research with only a small number of contributions. So the complexity of BDLP is put forward to assess the BDLP´s quality. The diagram entropy model which applied on the program maintenance complexity in software engineering is introduced to quantify the complexity of BDLP. Both the method of generating information structure diagram (ISG) and action control diagram (ACG) are given. To validate the relationship between the complexity value and the locating time which is an important factor of BDLP´s quality, a non-linear cure fitting is introduced, and they are consistent correlative proved by the result. An instance is given to explain this method.
Keywords :
entropy; military computing; software maintenance; ACG; BDLP complexity; BDLP quality; ISG; action control diagram; battle damage location process; diagram entropy model; information structure diagram; location ability; nonlinear cure fitting; program maintenance complexity; software engineering; Complexity theory; Computational modeling; Entropy; Maintenance engineering; Software; Software engineering; Testing; complexity metrics; control diagram; damage location process; diagram entropy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
Type :
conf
DOI :
10.1109/QR2MSE.2013.6625890
Filename :
6625890
Link To Document :
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