Title :
Solution of EMC problems via analysis methods: a review
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A comprehensive review is conducted of the most common and presently used analytical tools in the analysis and prediction of EMI. The study outlines the early fundamentals behind the theory of LRC network representation in the coupling mechanisms between noise-source and susceptible circuit elements. The work is extended to include the latest in computational electromagnetic techniques for the analysis of complex topological EMC problems
Keywords :
circuit analysis computing; electromagnetic compatibility; equivalent circuits; network topology; LRC network representation; analytical tools; computational electromagnetic techniques; coupling mechanisms; prediction of EMI; topological EMC problems; Coupling circuits; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic coupling; Electromagnetic interference; Electronic equipment testing; Hardware; Manufacturing; System testing;
Conference_Titel :
Electromagnetic Compatibility, 1992. From a Unified Region to a Unified World., 1992 Regional Symposium on
Conference_Location :
Tel-Aviv
Print_ISBN :
0-7803-0725-9
DOI :
10.1109/ISEMC.1992.257532
