Title :
Economics modelling and optimisation of MCM test strategies
Author :
Dislis, C. ; Jalowiecki, I.P.
Author_Institution :
Dept. of Cybern., Reading Univ., UK
Abstract :
This paper presents a decision support system for the objective evaluation and optimisation of MCM test options, including boundary scan provision. The system is driven by a detailed cost model of the MCM manufacture and test process. The cost modelling can be extended to model the partial scan provision
Keywords :
boundary scan testing; decision support systems; economics; integrated circuit manufacture; integrated circuit testing; multichip modules; optimisation; MCM test strategies; boundary scan provision; cost model; decision support system; economics modelling; optimisation; test options evaluation; Costs; Cybernetics; Decision support systems; Design for testability; Electronic equipment testing; Manufacturing processes; Procurement; Semiconductor device modeling; System testing; Virtual manufacturing;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494379
