DocumentCode :
3442410
Title :
Fault prognostic technology of complex electronic equipment for PHM
Author :
Xi-Shan Zhang ; Xin-Yue Li ; Kao-Li Huang ; Peng-Cheng Yan ; Guang-Yao Lian ; Shao-Guang Wang
Author_Institution :
Ordnance Eng. Coll., Shijiazhuang, China
fYear :
2013
fDate :
15-18 July 2013
Firstpage :
1790
Lastpage :
1792
Abstract :
In order to realize the complex electronic equipment prognostic and health management, it needs to research its core technology in fault prognostic. Based on the existing fault prognostic methods, this paper puts forward a support vector machine nonlinear fault prognostic model based on performance degradation data as input and reliability data as output. The working principle of fault prognostic model is to train multioutput SVM to fit the nonlinear relationship between performance degradation data and reliability data. The reliability of components can be predicted by using the trained SVM. Finally, a magnetron experimental data as an example is used to verify the prognostic model in terms of prognostics for the electronic products.
Keywords :
condition monitoring; electronic products; fault diagnosis; production engineering computing; reliability; support vector machines; PHM; SVM; electronic equipment; fault prognostic technology; performance degradation; prognostic and health management; support vector machine nonlinear fault prognostic model; Data models; Degradation; Maintenance engineering; Monitoring; Prognostics and health management; Reliability; Support vector machines; fault prognostic; multi-output support vector machine; performance degradation data; prognostic and health management; reliability data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
Type :
conf
DOI :
10.1109/QR2MSE.2013.6625924
Filename :
6625924
Link To Document :
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