Title :
Setting and validating precision requirements in the digital VLSI implementation of a neural defect-identifier for machined objects
Author :
Alippi, Cesare ; Briozzo, Luciano
Author_Institution :
Dipartimento di Elettronica, Politecnico di Milano, Italy
fDate :
30 May-2 Jun 1994
Abstract :
In this paper we deal with the functional design of a dedicated digital VLSI neurochip for a real time demanding application: the identification of defects in machined parts of mechanical objects. Precision requirements analysis (in terms of the bits number to represent neural values) represents a critical point to be faced when choosing the final architecture since requirements on the chip´s size may prevent parallelism exploitation. Application features and neural dynamics are thus carefully analysed to determine quasi-minimal bit requirements for the architectural components. Afterwards, once the hardware design has been defined, sensitivity analysis tools need to be applied to validate effective performances. It is shown that an accurate choice of precision requirements for hardware elements, despite poor signal to noise ratios, leads to a suitable architecture which solves the application and makes feasible the VLSI design
Keywords :
VLSI; application specific integrated circuits; digital signal processing chips; flaw detection; image classification; image processing equipment; inspection; integrated circuit design; neural chips; neural net architecture; parallel architectures; sensitivity analysis; VLSI design; application features; dedicated digital VLSI neurochip; functional design; image processing; machined objects; machined parts defect identification; mechanical objects; neural defect-identifier; neural dynamics; parallelism; precision requirements analysis; quasi-minimal bit requirements; real time application; sensitivity analysis tools; signal to noise ratio; Computer architecture; Hardware; Image processing; Microelectronics; Parallel processing; Pixel; Sensitivity analysis; Signal design; Signal to noise ratio; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409633