Title :
Hardware-Assisted Reliability Enhancement for Embedded Multi-core Virtualization Design
Author :
Tsung-Han Lin ; Kinebuchi, Y. ; Shimada, Hiroki ; Mitake, Hironori ; Chen-Yi Lee ; Nakajima, T.
Author_Institution :
Dept. of Comput. Sci. & Eng., Waseda Univ., Tokyo, Japan
Abstract :
In this paper, we propose a virtualization architecture for the multi-core embedded system to provide more sys-tem reliability and security while maintaining the same performance without introducing additional special hardware supports or having to implement complex protection mechanism in the virtualization layer. Embedded virtualization design usually uses two kinds of approaches, traditional VMM and microkernel approaches, but both of them suffer from performance or engineering cost problems. To achieve better reliability and keep the virtualization layer design light weighted, a common hardware component called local memory adopted in the multi-core embedded processors is used in this work. By taking this memory ar-chitecture´s advantage, we can mitigate above-mentioned problems at once. We choose to re-map the virtualizationlayer´s program called SPUMONE, which it runs all its guest systems in kernel space, on the local memory. By doing so, it can provide additional reliability and security for the entire system because the SPUMONE´s design in a multi-core platform has each instance being installed on a separated processor core, which is different from the traditional virtualization layer design, and therefore the content of each SPUMONE in the local memory is inaccessible to each others.
Keywords :
embedded systems; memory architecture; multiprocessing systems; reliability; virtualisation; SPUMONE; complex protection mechanism; embedded multicore virtualization design; embedded virtualization design; hardware-assisted reliability enhancement; local memory; memory architecture; microkernel approach; multicore embedded system; security; system reliability; virtualization architecture; Embedded systems; Hardware; Kernel; Multicore processing; Reliability; Virtual machine monitors; embedded system; local memory; virtualization;
Conference_Titel :
Embedded and Real-Time Computing Systems and Applications (RTCSA), 2011 IEEE 17th International Conference on
Conference_Location :
Toyama
Print_ISBN :
978-1-4577-1118-3
DOI :
10.1109/RTCSA.2011.24