Author :
Theuwissen, Albert J P ; Bosiers, Jan T. ; Roks, Edwin
Author_Institution :
DALSA Digital Imaging, Eindhoven
Abstract :
The importance of holes in solid-state image sensors is described. Today´s success of digital imaging is based on the positive effect of an accumulation layer that reduces the interface-related dark current and dark current fixed-pattern noise. This superb imaging feature is applied in CCD as well as in CMOS devices, in consumer as well as in professional equipment. Holes are not only used to improve the dark performance of imagers, other examples are fixing electrostatic potentials, creating gate structures, draining photon-generated charges and constructing output-amplifier stages
Keywords :
CCD image sensors; CMOS image sensors; electrostatics; CCD devices; CMOS devices; accumulation layer; digital imaging; electrostatic potentials; fixed-pattern noise; gate structures; interface-related dark current; photon-generated charges; solid-state image sensors; Charge coupled devices; Clocks; Dark current; Digital images; Electrostatics; Image sensors; Implants; Noise reduction; Pixel; Solid state circuits;
Conference_Titel :
Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-9268-X
DOI :
10.1109/IEDM.2005.1609476
