Title :
A step-by-step method for elimination of burn-in as a necessary screen
Author :
Turner, Timothy E.
Author_Institution :
Keithley Instrum. Inc., Cleveland, OH, USA
Abstract :
Burn-in is an expensive technique and is far from the most effective technique available for reliability improvement or process monitoring. One hundred percent burn-in programs required by high infant mortality programs can be eliminated by a combination of in-line testing and process improvements driven by improved feedback techniques. Sample burn-in programs can be eliminated through the use of hierarchical proactive reliability monitoring programs based on the process, not the product
Keywords :
integrated circuit reliability; integrated circuit testing; burn-in; feedback; in-line testing; infant mortality; process monitoring; reliability monitoring; screen; Costs; Delay effects; Electronics industry; Etching; Humans; Modems; Process control; Raw materials; Semiconductor materials; Temperature control;
Conference_Titel :
Integrated Reliability Workshop, 1996., IEEE International
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
0-7803-3598-8
DOI :
10.1109/IRWS.1996.583389
