Title :
Systematic Errors in Noise Parameter Determination Due to Imperfect Source Impedance Measurement
Author :
Wiatr, W. ; Walker, D.
Author_Institution :
Warsaw Univ. of Technol.
Abstract :
The paper presents a rigorous analysis of systematic errors in the four-noise parameter determination of a two-port network using the cold-source technique. The method is based on an original model that accounts for imperfectly-measured source reflection coefficients due to residual errors within a vector network analyzer (VNA). The authors show that even small VNA errors may seriously deteriorate the accuracy of the noise parameters when characterizing low-noise pseudomorphic high-electron mobility transistors (PHEMTs)
Keywords :
electric noise measurement; high electron mobility transistors; measurement errors; network analysers; two-port networks; cold-source technique; imperfect source impedance measurement; noise parameter determination; pseudomorphic high electron mobility transistors; source reflection coefficients; systematic errors; two-port network; vector network analyzer; Acoustic reflection; Calibration; Error analysis; Impedance measurement; Measurement errors; Measurement standards; Noise measurement; PHEMTs; Power system modeling; Temperature measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305285
