DocumentCode :
3448120
Title :
Investigation of aluminum induced degradation in sputtered Al:ZnO for CIGS solar cells applications
Author :
Pan, Jie ; Kerr, Lei ; Li, Xiaonan ; Gulley-Stahl, Heather J. ; Sommer, Andre J.
Author_Institution :
Dept. of Paper & Chem. Eng., Miami Univ., Miami, OH, USA
fYear :
2009
fDate :
7-12 June 2009
Abstract :
The long term performance of Cu(In, Ga)Se2 (CIGS) solar cells were strongly affected by their ability in withstanding surrounding weather change, including temperature, humidity, and light, etc. In our experiment, we focused on the stability study of window layer materials of undoped ZnO (IZO) and Al:ZnO (AZO) using damp heat and dry heat treatment. We found that the Al dopant had enhanced the capture of moisture in ZnO, and thus caused the degradation in film optical, morphological and electrical properties.
Keywords :
Fourier transform spectra; II-VI semiconductors; aluminium; electrical resistivity; heat treatment; infrared spectra; scanning electron microscopy; semiconductor thin films; ultraviolet spectra; visible spectra; wide band gap semiconductors; zinc compounds; Fourier transform infrared spectroscopy; UV-VIS spectra; ZnO; ZnO:Al; damp heat treatment; dry heat treatment; electrical properties; four point probe method; moisture capture; morphological properties; optical properties; resistivity; scanning electron microscopy; solar cells; stability; transmission spectra; window layer materials; Aluminum; Degradation; Heat treatment; Humidity; Optical films; Optical materials; Photovoltaic cells; Stability; Temperature; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411667
Filename :
5411667
Link To Document :
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