• DocumentCode
    3448241
  • Title

    Comparison of IMGC and PTB Absolute Determinations of the Si(220) Lattice Spacing

  • Author

    Becker, P. ; Kuetgens, U. ; Mana, G. ; Massa, E.

  • Author_Institution
    Phys.-Technische Bundesanstalt, Braunschweig
  • fYear
    2004
  • fDate
    38139
  • Firstpage
    441
  • Lastpage
    442
  • Abstract
    If we want to base the kilogram definition on the mass of the 28Si atom, the present uncertainty of the Si (220) lattice plane spacing has to be lowered by a factor ten. On the way to achieve this improvement, the comparison between the lattice spacing determinations obtained by combined X-ray and optical interferometry via the Si crystal standards MO*4 and WS5C of the IMGC and the WASO 4.2a one of the PTB is intended to assess the 0.16 part per million shift between the lattice spacing values recently obtained in a joint IMGC-NMIJ measurement and the past values obtained by IMGC and PTB
  • Keywords
    atomic mass; constants; crystal structure; interferometry; measurement uncertainty; 28Si atom; IMGC; MO*4; PTB; Si; Si (220) lattice plane spacing; WASO 4.2a; WS5C; X-ray; crystal standards; optical interferometry; Atomic measurements; Crystals; Geometry; Laboratories; Lattices; Manufacturing; Measurement standards; Metrology; Optical interferometry; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2004 Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-8494-6
  • Electronic_ISBN
    0-7803-8494-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2004.305300
  • Filename
    4097311
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3448241