DocumentCode :
3448322
Title :
The structural evolution of CGS thin film during three-stage deposition process
Author :
Al-Thani, H.A. ; Hasoon, F.S.
Author_Institution :
Nat. Energy & Water Res. Center, Abu Dhabi, United Arab Emirates
fYear :
2009
fDate :
7-12 June 2009
Abstract :
CGS thin films were deposited on Molybdenum coated soda lime glass (Mo/SLG) substrates, using physical vapor deposition (PVD) 3-stage process. In order to study the evolution of the CGS growth process and the Na out-diffusion in the CGS films from SLG substrates, the structural phase transitions were traced in the CGS films indicated by multiple exothermic reactions that occur during the growth process. The CGS films´ structure was examined and the films´ growth phase was identified by applying ¿/2¿ X-Ray Diffraction characterization technique. Secondary-ion mass spectrometry (SIMS) was also applied to depth profile the Na in the CGS/Mo/SLG films.
Keywords :
X-ray diffraction; copper compounds; diffusion; gallium compounds; secondary ion mass spectra; semiconductor growth; semiconductor thin films; solid-state phase transformations; ternary semiconductors; vacuum deposited coatings; vacuum deposition; CuGaSe3; Mo-Na2O-CaO-SiO2; Na2O-CaO-SiO2; X-ray diffraction; multiple exothermic reactions; out-diffusion; physical vapor deposition; secondary-ion mass spectrometry; structural evolution; structural phase transitions; thin films; Atherosclerosis; Chemical vapor deposition; Glass; Laboratories; Photonic band gap; Renewable energy resources; Sputtering; Substrates; Temperature; Thin film devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411677
Filename :
5411677
Link To Document :
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