First tests of the Trapped Ion Source

Author

Variale, V. ; Valentino, V. ; Brautti, G. ; Boggia, A. ; Raino, A.

Author_Institution

INFN, Bari, Italy

Volume

3

fYear

1999

fDate

1999

Firstpage

1905

Abstract

Recently the detailed design and the construction problems of a Trapped Ion Source (TIS) have been presented previously. In practice, TIS can be seen as a modified version of an Electron Beam Ion Trap (EBIT) or of an Electron Beam Ion Source (EBIS). The main new feature of TIS, with respect to an EBIS (or EBIT), is the transverse ion confinement given by a quadrupole field instead of the electron beam space charge. One can foresee that TIS could overcome some drawbacks of the EBIT and EBIS making it a more flexible device. In this paper a detailed discussion on the radiofrequency containment of high charge state ions with the first RF containment test is presented

Keywords

ion sources; particle traps; space charge; EBIS; EBIT; Electron Beam Ion Source; Electron Beam Ion Trap; RF containment test; Trapped Ion Source; electron beam space charge; high charge state ions; quadrupole field; radiofrequency containment; transverse ion confinement; Acceleration; Electrodes; Electron beams; Electron traps; Ion beams; Ion sources; Particle separators; Radio frequency; Space charge; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1999. Proceedings of the 1999

Conference_Location

New York, NY

Print_ISBN

0-7803-5573-3

Type

conf

DOI

10.1109/PAC.1999.794299

Filename

794299