Title :
Oversampling Delta-Sigma ADC for Metrology Applications
Author :
Georgakopoulos, D. ; Pickering, J.R. ; Williams, J.M. ; Wright, P.S.
Author_Institution :
National Phys. Lab., Teddington
Abstract :
This paper focuses on the performance of the Delta-Sigma ADC for metrology applications and presents a quantum based Delta-Sigma ADC under development by Metron Designs and the National Physical Laboratory which is suitable for DC and low frequency spectrum analysis, voltage and power measurements
Keywords :
power system measurement; sigma-delta modulation; spectral analysers; voltage measurement; DC spectrum analysis; delta-sigma ADC; low frequency spectrum analysis; metrology applications; oversampling; power measurement; voltage measurement; Analog-digital conversion; Circuit noise; Digital filters; Jitter; Laboratories; Metrology; Noise reduction; Power measurement; Signal to noise ratio; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305466
