DocumentCode :
3450882
Title :
Turing´s instability as a failure mechanism of GTOs
Author :
Gorbatyuk, A.V. ; Rodin, P.B.
Author_Institution :
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
fYear :
1994
fDate :
31 May-3 Jun 1994
Firstpage :
227
Lastpage :
231
Abstract :
The destructive phenomena caused by the so called Turing´s instability (periodic in space) is illustrated for the case of GTO switching-off process. Using the simplified 3D analytical approach it is shown that this instability can emerge when the whole system still remains in the state with the positive differential resistance but the differential resistance of its active “hidden” part yet becomes negative. The suggested model explains satisfactorily the experiments on spatially periodic destruction of GTO and predicts the same type of failure behavior for other thyristor-like devices
Keywords :
failure analysis; 3D analytical approach; GTOs; Turing´s instability; destructive phenomena; failure behavior; failure mechanism; model; positive differential resistance; spatially periodic destruction; switching-off process; thyristor-like devices; Cathodes; Chemical technology; Electric breakdown; Extraterrestrial phenomena; Failure analysis; Pattern formation; Predictive models; Solids; Thyristors; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
Conference_Location :
Davos
ISSN :
1063-6854
Print_ISBN :
0-7803-1494-8
Type :
conf
DOI :
10.1109/ISPSD.1994.583728
Filename :
583728
Link To Document :
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