• DocumentCode
    3451127
  • Title

    Bipolar power device performance: dependence on materials, lifetime and device ratings

  • Author

    Bhalla, Anup ; Chow, T. Paul

  • Author_Institution
    Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    1994
  • fDate
    31 May-3 Jun 1994
  • Firstpage
    287
  • Lastpage
    292
  • Abstract
    The performance of bipolar devices fabricated using Si, Ge, 3C-SiC, 6H-SiC and Diamond is theoretically examined as a function of designed breakdown voltage, operating current density and carrier lifetime using analytic models. It is shown that wide bandgap materials become advantageous for high blocking voltages, where the use of Si is precluded by its large forward drop. Wide bandgap materials may be used to simultaneously achieve high off-state blocking and fast turn-off capability by using low lifetimes, with minor penalties on their forward performance
  • Keywords
    power semiconductor devices; 3C-SiC; 6H-SiC; C; Ge; Si; SiC; analytic models; bipolar power device; blocking voltages; breakdown voltage; carrier lifetime; current density; diamond; off-state blocking; turn-off capability; wide bandgap materials; Charge carrier lifetime; Conducting materials; Current density; Doping; Photonic band gap; Semiconductor diodes; Semiconductor materials; Silicon; Spontaneous emission; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
  • Conference_Location
    Davos
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-1494-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1994.583744
  • Filename
    583744