DocumentCode :
3451127
Title :
Bipolar power device performance: dependence on materials, lifetime and device ratings
Author :
Bhalla, Anup ; Chow, T. Paul
Author_Institution :
Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1994
fDate :
31 May-3 Jun 1994
Firstpage :
287
Lastpage :
292
Abstract :
The performance of bipolar devices fabricated using Si, Ge, 3C-SiC, 6H-SiC and Diamond is theoretically examined as a function of designed breakdown voltage, operating current density and carrier lifetime using analytic models. It is shown that wide bandgap materials become advantageous for high blocking voltages, where the use of Si is precluded by its large forward drop. Wide bandgap materials may be used to simultaneously achieve high off-state blocking and fast turn-off capability by using low lifetimes, with minor penalties on their forward performance
Keywords :
power semiconductor devices; 3C-SiC; 6H-SiC; C; Ge; Si; SiC; analytic models; bipolar power device; blocking voltages; breakdown voltage; carrier lifetime; current density; diamond; off-state blocking; turn-off capability; wide bandgap materials; Charge carrier lifetime; Conducting materials; Current density; Doping; Photonic band gap; Semiconductor diodes; Semiconductor materials; Silicon; Spontaneous emission; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
Conference_Location :
Davos
ISSN :
1063-6854
Print_ISBN :
0-7803-1494-8
Type :
conf
DOI :
10.1109/ISPSD.1994.583744
Filename :
583744
Link To Document :
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