• DocumentCode
    3451949
  • Title

    Register Transfer Level Concurrent Error Detection in Elliptic Curve Crypto Implementations

  • Author

    Stern, Richard ; Joshi, Nikhil ; Wu, Kaijie ; Karri, Ramesh

  • Author_Institution
    L3 Commun., Brooklyn
  • fYear
    2007
  • fDate
    10-10 Sept. 2007
  • Firstpage
    112
  • Lastpage
    119
  • Abstract
    In this paper we present an register transfer level (RTL) concurrent error detection (CED) technique targeting hardware implementations of elliptic curve cryptography (ECC). The proposed mixed hardware- and time-redundancy based CED techniques use the mathematical properties of the underlying Galois field as well as the ECC primitives to detect both soft errors and permanent faults with low area overhead. Results for sequential implementations of GF multiplication and inverse operations yielded an area overhead of 30% and a time overhead of 120%.
  • Keywords
    cryptography; Galois field; elliptic curve crypto implementations; elliptic curve cryptography; mixed hardware techniques; register transfer level concurrent error detection; time-redundancy based CED techniques; Circuit faults; Elliptic curve cryptography; Elliptic curves; Fault detection; Frequency; Hardware; Public key cryptography; Redundancy; Single event transient; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault Diagnosis and Tolerance in Cryptography, 2007. FDTC 2007. Workshop on
  • Conference_Location
    Vienna
  • Print_ISBN
    978-0-7695-2982-0
  • Type

    conf

  • DOI
    10.1109/FDTC.2007.17
  • Filename
    4318991