DocumentCode
3451949
Title
Register Transfer Level Concurrent Error Detection in Elliptic Curve Crypto Implementations
Author
Stern, Richard ; Joshi, Nikhil ; Wu, Kaijie ; Karri, Ramesh
Author_Institution
L3 Commun., Brooklyn
fYear
2007
fDate
10-10 Sept. 2007
Firstpage
112
Lastpage
119
Abstract
In this paper we present an register transfer level (RTL) concurrent error detection (CED) technique targeting hardware implementations of elliptic curve cryptography (ECC). The proposed mixed hardware- and time-redundancy based CED techniques use the mathematical properties of the underlying Galois field as well as the ECC primitives to detect both soft errors and permanent faults with low area overhead. Results for sequential implementations of GF multiplication and inverse operations yielded an area overhead of 30% and a time overhead of 120%.
Keywords
cryptography; Galois field; elliptic curve crypto implementations; elliptic curve cryptography; mixed hardware techniques; register transfer level concurrent error detection; time-redundancy based CED techniques; Circuit faults; Elliptic curve cryptography; Elliptic curves; Fault detection; Frequency; Hardware; Public key cryptography; Redundancy; Single event transient; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault Diagnosis and Tolerance in Cryptography, 2007. FDTC 2007. Workshop on
Conference_Location
Vienna
Print_ISBN
978-0-7695-2982-0
Type
conf
DOI
10.1109/FDTC.2007.17
Filename
4318991
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