DocumentCode :
3452560
Title :
An AC-based capacitance measuring circuit for tomography systems and its silicon chip design
Author :
Hähnel, H. ; Yang, W.Q. ; York, Trevor A.
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
fYear :
1995
fDate :
35040
Firstpage :
42522
Lastpage :
42529
Abstract :
The electrical capacitance tomography (ECT) system developed at UMIST employs the charge/discharge capacitance measuring circuit. The problem with this circuit is that a lot of CMOS switches are used to control charge/discharge operation and to select excitation and detection electrodes, and these switches cause charge injection problems. This paper describes an AC-based capacitance measuring circuit designed for ECT systems. In this circuit there are no CMOS switches directly connected to measurement electrodes, and therefore there is no charge injection problem. A silicon chip has been designed for this circuit using the standard cells in the MIETEC CMOS library. Simulation results show that the silicon chip will perform well at 500 kHz
Keywords :
CMOS analogue integrated circuits; SPICE; capacitance measurement; electrodes; integrated circuit design; intelligent sensors; step response; tomography; 500 kHz; AC-based capacitance measuring circuit; CMOS switches; MIETEC CMOS library; Si; analogue layout; charge injection problems; charge/discharge capacitance measuring circuit; electrical capacitance tomography system; intelligent measurement electrodes; linearity; pipeline imaging; process tomography; sensitivity; step response; stray capacitance; transient time simulation;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Advances in Sensors, IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19951510
Filename :
495020
Link To Document :
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