DocumentCode :
3452579
Title :
Optical measurement and simulation of morpho-butterfly-scales quasi-structure using focused-lon-beam chemical-vapor-deposition
Author :
Watanabe, Keiichiro ; Hoshino, Takayuki ; Kondo, Kazushige ; Kanda, Kazuhiro ; Haruyama, Yuichi ; Kaito, Takashi ; Matsui, Shinji
fYear :
2004
fDate :
Oct. 27-29, 2004
Firstpage :
64
Lastpage :
65
Keywords :
Chemical technology; Equations; Focusing; Nanostructures; Nanotechnology; Optical device fabrication; Optical reflection; Reproducibility of results; Scanning electron microscopy; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN :
4-99024720-5
Type :
conf
DOI :
10.1109/IMNC.2004.245724
Filename :
1459474
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3452579
