DocumentCode
345261
Title
Measurement and simulation results of Ti coated microwave absorber
Author
Sun, Ding ; McGinnis, David
Author_Institution
Fermi Nat. Accel. Lab., Batavia, IL, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
854
Abstract
Microwave absorbers are coated with resistive thin films. S parameters are measured before and after coating. The measured data are used to check the simulation results of software HFSS which are in good agreement with the measurement results
Keywords
S-parameters; beam handling equipment; electromagnetic wave absorption; metallic thin films; titanium; HFSS; S parameters; Ti; Ti coated microwave absorber; resistive thin films; Coatings; Electrical resistance measurement; Ferrites; Microwave measurements; Permeability measurement; Permittivity measurement; Software measurement; Sputtering; Surface resistance; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location
New York, NY
Print_ISBN
0-7803-5573-3
Type
conf
DOI
10.1109/PAC.1999.795378
Filename
795378
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